ChipsPhys.org Technologyabout 2 hours ago
New Lens Reveals Hidden Chip Defects
3 min read
A team at DGIST developed a threaded ultrasound lens that reduces internal noise to reveal ultrafine defects in semiconductor chips. Published in NDT & E International in 2027, the research establishes optimal specifications with a height of 500 μm and an inclination angle of 30°.
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