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Researchers at the U.S. Department of Energy's Argonne National Laboratory recently demonstrated agentic AI for self-guided X-ray scans of microelectronics. The SYNAPS-I project, led by Lawrence Berkeley National Laboratory, integrates data from neutron, X-ray, and microscopy experiments. Using natural language, scientists direct the AI to locate specific regions within integrated circuit devices, automating tasks like region-of-interest searches and high-resolution scanning.
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