SciencePhys.org Technologyabout 1 hour ago
KAIST Maps RRAM Filament Paths in 3D
4 min read
Researchers at KAIST used conductive atomic force microscopy tomography to map nanoscale current pathways in a resistive random-access memory device. Published in Nano Letters in 2026, the study reveals filaments connect to electrode protrusions. The team examined five sites on a 10-nanometer titanium dioxide layer, finding oxygen vacancies cluster tightly near the bottom electrode to guide filament formation.
Level
Hype check
Tap to vote and see what everyone thinks.